Shared Service

Large-scale research equipment and laboratories / Imaging Systems

Electron Microscopy

Strain-field measurements (TEM/STEM)

Usable by: HU | TU | FU | Charité

Strain measurements by means of S/TEM techniques like GPA, NBED, Dark-Field Electron Holography, or 4D-STEM

Further information:

https://bua.openiris.io/Landing/Resource?id=26950

Possible user: No restrictions

Note

Please contact Dr. Tore Niermann for discusion of your scientific problem.

Provider:

FG Elektronen- und Ionen-Nanooptik

Provider Location:

Ernst-Ruska-Building