Shared Service

Large-scale research equipment and laboratories / Imaging Systems

Scanning Transmission Electron Microscope STEM TEM

TEM STEM JEOL JEM-ARM300F2

Usable by: HU | TU | FU | Charité

Ultra High Resolution Probe-Corrected 60- to 300kV-STEM, 2.2 sr EDX-/EDS-SDD, MERLIN Direct Electron Detector with Pulse Counting

Phase sensitive Analysis Methods in Cooperation with Chair Experimental Physics/Electron- and Ion-Nanooptics, Prof. M. Lehmann

Detailed information can be found on the ZELMI website here

Further information:

https://bua.openiris.io/Landing/Resource?id=24535

Possible user: No restrictions

Note

Please contact Mr. Sören Selve to get access.

Email: soeren.selve@tu-berlin.de - Phone +49 30 314 26832

Provider:

Zentraleinrichtung Elektronenmikroskopie

Provider Location:

TU Berlin

Location:

Building: TEM